TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT METHOD

专利名称：TERAHERTZ-WAVE SPECTROSCOPIC

MEASUREMENT METHOD

发明人：AKIYAMA, Kouichiro,YASUDA,

Takashi,KAWADA, Yoichi,NAKANISHI, Atsushi

申请号：EP13796936.6申请日：20130502公开号：EP2857827B1公开日：20171011

摘要：A prism member having an entrance surface for arranging a terahertz-wavegenerator for generating a terahertz wave in response to pump light incident thereon, anarrangement part for arranging an object to be measured, an exit surface for arranging aterahertz-wave detector for detecting a correlation between the terahertz wavetransmitted through the object in the arrangement part and probe light, a first opticalsurface for collimating or condensing the terahertz wave incident thereon from theentrance surface toward the arrangement part, and a second optical surface forcondensing the terahertz wave transmitted through the arrangement part toward theexit surface, the arrangement part forms a depression adapted to be filled with a liquidincapable of dissolving the object therein.

申请人：HAMAMATSU PHOTONICS KK

地址：JP

国籍：JP

代理机构：Boult Wade Tennant

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