Apparatus and method for measuring frequency respo

专利名称：Apparatus and method for measuring

frequency response function

发明人：Takahiro Yamaguchi,Toshiharu

Kasahara,Hiromi Kosawa

申请号：US07/271879申请日：19881116公开号：US04885708A公开日：19891205

摘要：A plurality of relatively prime excitation waveforms are generated and appliedto an object to be measured. Data of the excitation waveforms and a response waveformfrom the object are extracted by one frame every n frames and subjected to Fouriertransform, thereby computing an input auto spectral matrix and an input-output crossspectral matrix. A frequency response function of the object is calculated from averagedspectral matrices obtained by adding and averaging corresponding elements of thecorresponding spectral matrices a predetermined number of times. Readout startaddresses for multiple waveforms, each stored in one of a plurality of waveformmemories and having continuity at both ends, are shifted relative to each other every nframes, thereby obtaining the plurality of relatively prime excitation waveforms.

申请人：ADVANTEST CORPORATION

代理机构：Staas & Halsey

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