Color Inspection System

专利名称：Color Inspection System

发明人：Takao Ebita,Norihiro Ogata,Masahiro

Matsumura,Keiichirou Tabata

申请号：US11795707申请日：20060329

公开号：US20090190132A1公开日：20090730

专利附图：

摘要：The objective of the invention is to provide a color inspection system capable ofmaking determination on pass or failure with accuracy equivalent to that for the case ofvisual inspection even in the case of inspecting various textile products as measurement

targets, such as a raised cloth, cloth with printed patterns such as marbled pattern, moirepattern and detailed pattern, and so forth. With a color inspection system, an illuminant isset to shine light on the surface of a textile product M placed on the top surface of ameasuring platform to thereby make measurements from a direction at an angle of 45degrees from the surface of a measuring region of the textile product M by use of aspectroradiometer of a measuring unit. The spectroradiometer is provided with a widerange lens attached thereto to thereby expand a measuring region. The results ofmeasurement by the spectroradiometer are inputted to an information processor of adetermination unit. The information processor computes color values for the wholemeasuring region to be compared with standard color values stored in a memory tothereby make determination on pass or fail.

申请人：Takao Ebita,Norihiro Ogata,Masahiro Matsumura,Keiichirou Tabata

地址：Fukui JP,Fukui JP,Fukui JP,Fukui JP

国籍：JP,JP,JP,JP

更多信息请下载全文后查看